Measurement Systems Analysis
Quality Control, Quality Assurance, Process Improvements are all dependent on correct measurements. If the measurements are erroneous wrong decisions will be made. Measurement error can consist of bias, reproducibility and repeatability. Historically, prior to modern computing power these were quantified through control chart methods. More recently Analysis of Variance was introduced, but at a very elementary level, usually applied to just one measuring device at a time.
Fully utilizing machine power, BIS.Net Analyst has increased the applications more suitable for todays real-world. Included are Dart Boards, Bias (One Equipment, One Appraiser, Multiple Parts), Bias (Multiple Equipment, One Appraiser, One Part), Bias (Multiple Parts, One Equipment, Multiple Appraisers), Gauge R&R (Multiple Equipment, Multiple Appraisers, One Part), Multi Equipment Linearity, Bias (Multiple Equipment, one appraiser), Nested Gauge R&R (Multiple appraisers, multiple equipment, one part). These technologies reflect todays manufacturing environment where different devices are used to measure the same characteristics.